publications
2024
- ElectronicsExploring hardware fault impacts on different real number representations of the structural resilience of tcus in gpusElectronics, 2024
- JETA’24Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUsJournal of Electronic Testing, 2024
- VTS’24Special session: Reliability assessment recipes for dnn acceleratorsIn 2024 IEEE 42nd VLSI Test Symposium (VTS), 2024
- LATS’24An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAsIn 2024 IEEE 25th Latin American Test Symposium (LATS), 2024
- LATS’24Assessing the Reliability of Different Split Computing Neural Network ApplicationsIn 2024 IEEE 25th Latin American Test Symposium (LATS), 2024
- VTS’24Evaluating the Reliability of Supervised Compression for Split ComputingIn 2024 IEEE 42nd VLSI Test Symposium (VTS), 2024
- VTS’24Analyzing the impact of scheduling policies on the reliability of GPUs running CNN operationsIn 2024 IEEE 42nd VLSI Test Symposium (VTS), 2024
- ETS’24Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN OperationsIn 2024 IEEE European Test Symposium (ETS), 2024
- IOLTS’24Effective Application-level Error Modeling of Permanent Faults on AI AcceleratorsIn 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024
- IOLTS’24Enhancing the Reliability of Split Computing Deep Neural NetworksIn 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024
- VLSI-SoC’24Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number FormatsIn VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence, 2024
2023
- SC’23Understanding the Effects of Permanent Faults in GPU’s Parallelism Management and Control UnitsIn Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, 2023
- IEEE Design & TestSTLs for GPUs: using high-level language approachesIEEE Design & Test, 2023
- DATE’23Assessing convolutional neural networks reliability through statistical fault injectionsIn 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023
- DDECS’23A reliability-aware environment for design exploration for gpu devicesIn 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2023
- LATS’23Analyzing the architectural impact of transient fault effects in sfus of gpusIn 2023 IEEE 24th Latin American Test Symposium (LATS), 2023
- ETS’23Evaluating the Prevalence of SFUs in the Reliability of GPUsIn 2023 IEEE European Test Symposium (ETS), 2023
- ISIE’23Reliability estimation of split dnn models for distributed computing in iot systemsIn 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), 2023
- AICT’23Optimizing the Analysis and Evaluation of Logic Simulation Workloads in HPC SystemsIn 2023 IEEE 17th International Conference on Application of Information and Communication Technologies (AICT), 2023
- VLSI-SoC’23Analyzing the impact of different real number formats on the structural reliability of TCUs in gpusIn 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC), 2023
2022
- DATE’22A compaction method for STLs for GPU in-field testIn 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022
- ITC’22A multi-level approach to evaluate the impact of GPU permanent faults on CNN’s reliabilityIn 2022 IEEE International Test Conference (ITC), 2022
- IEEE Design & TestUsing STLs for effective in-field test of GPUsIEEE Design & Test, 2022
- ITC-Asia’22Evaluating the impact of Permanent Faults in a GPU running a Deep Neural NetworkIn 2022 IEEE International Test Conference in Asia (ITC-Asia), 2022
- IEEE TNSCharacterizing a neutron-induced fault model for deep neural networksIEEE Transactions on Nuclear Science, 2022
- VTS’22A new method to generate software test libraries for in-field GPU testing resorting to high-level languagesIn 2022 IEEE 40th VLSI Test Symposium (VTS), 2022
- IOLTS’22Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNsIn 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022
- ISIE’22Reliability assessment of neural networks in gpus: A framework for permanent faults injectionsIn 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE), 2022
- ICECS’22Neural Network’s Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUsIn 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022
- ETS’22Test, reliability and functional safety trends for automotive system-on-chipIn 2022 IEEE European Test Symposium (ETS), 2022
2021
- DDECS’21On the functional test of special function units in gpusIn 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021
- ICECS’21Using hardware performance counters to support infield GPU testingIn 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), 2021
- ATS’21A novel compaction approach for SBST test programsIn 2021 IEEE 30th Asian Test Symposium (ATS), 2021
2020
- BEC’20Design and Verification of an open-source SFU model for GPGPUsIn 2020 17th Biennial Baltic Electronics Conference (BEC), 2020
2015
- DynaFPGA-based translation system from colombian sign language to textDyna, 2015